A frequency shift image of Atomic Force Microscopy (AFM) with the frequency modulation detection method is calculated.
Calculation is based on
quantum mechanical method, so that a more precise AFM frequency shift image is gained than by a classical mechanical calculation method.
It is suitable to examine properties of a sample of an organic molecule.
Kinds of chemical elements we can use as constituent elements of a tip and a sample is no less than 69 kinds described below, and almost all inorganic compounds and organic compounds can be used on simulation.
H, Li, Be, B, C, N, O, F, Na, Mg, Al, Si, P, S, Cl, K, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Rb, Sr, Y, Zr, Nb, Mo, Tc, Ru, Rh, Pd, Ag, Cd, In, Sn, Sb, Te, I, Cs, La, Ce, Ba, Gd, Tb, Dy, Ho, Er, Tm, Yb, W, Re, Ir, Pt, Au, Hg, Pb, Bi, U